BMBF 13N6918

Schmid, Martin, Mannhart, Jochen und Giessibl, Franz J. (2008) Searching atomic spin contrast on nickel oxide (001) by force microscopy. Physical Review B (PRB) 77 (4), 045402-1-045402-6.

Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), S. 1696-1701. Volltext nicht vorhanden.

Schmid, Martin, Renner, Andreas und Giessibl, Franz J. (2006) Device for in situ cleaving of hard crystals. Review of Scientific Instruments 77 (3), 036101-1-036101-7.

Zotti, Linda A., Hofer, Werner A. und Giessibl, Franz J. (2006) Electron scattering in scanning probe microscopy experiments. Chemical Physics Letters 420 (1-3), S. 177-182.

Giessibl, Franz J. (2005) AFM's path to atomic resolution. Materials Today 8 (5), S. 32-41.

Herz, Markus, Schiller, Christian H., Giessibl, Franz J. und Mannhart, Jochen (2005) Simultaneous current-, force-, and work-function measurement with atomic resolution. Applied Physics Letters 86 (15), 153101-1-153101-3.

Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F. (2005) Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite. Physical Review Letters (PRL) 94 (5), 056101-1-056101-4.

Giessibl, Franz J. und Reichling, Michael (2005) Investigating atomic details of the CaF₂(111) surface with a qPlus sensor. Nanotechnology 16 (3), S. 118-124.

Giessibl, Franz J., Hembacher, Stefan, Herz, Markus, Schiller, C. H. und Mannhart, Jochen (2004) Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor. Nanotechnology 15 (2), S. 79-86.

Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F. (2003) Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 100 (22), S. 12539-12542.

Giessibl, Franz J. (2003) Advances in Atomic Force Microscopy. Reviews of Modern Physics (RMP) 75 (3), S. 949-983.

Herz, Markus, Giessibl, Franz J. und Mannhart, F. (2003) Probing the shape of atoms in real space. Physical Review B (PRB) 68 (4), 045301-1-045301-7.

Giessibl, Franz J., Herz, Markus und Mannhart, Jochen (2002) Friction traced to the single atom. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 99 (19), S. 12006-12010.

Hembacher, Stefan, Giessibl, Franz J. und Mannhart, Jochen (2002) Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum. Applied Surface Science 188 (3-4), S. 445-449.

Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips. Applied Physics A: Materials Science & Processing 72 (Suppl1), S. 15-17.

Giessibl, Franz J. (2001) A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy. Applied Physics Letters 78 (1), S. 123-125.

Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen (2000) Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy. Science 289 (5478), S. 422-425.

Giessibl, Franz J. und Bielefeldt, Hartmut (2000) Physical interpretation of frequency-modulation atomic force microscopy. Physical Review B (PRB) 61 (15), S. 9968-9971.

Giessibl, Franz J. (2000) Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Applied Physics Letters 76 (11), S. 1470-1472.

Bielefeldt, Hartmut und Giessibl, Franz J. (1999) A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics. Surface Science 440 (3), L863-L867.

Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan und Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), S. 352-357.

Giessibl, Franz J. (1998) High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Applied Physics Letters 73 (26), S. 3956-3958.

Giessibl, Franz J. (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Physical Review B (PRB) 56 (24), S. 16010-16015.

Giessibl, Franz J. und Tortonese, Marco (1997) Self-oscillating mode for frequency modulation noncontact atomic force microscopy. Applied Physics Letters 70 (19), S. 2529-2531.