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Simultaneous current-, force-, and work-function measurement with atomic resolution

Herz, Markus and Schiller, Christian H. and Giessibl, Franz J. and Mannhart, Jochen (2005) Simultaneous current-, force-, and work-function measurement with atomic resolution. Applied Physics Letters 86 (15), p. 153101.

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Abstract

The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work-function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the ...

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Item Type:Article
Date:2005
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1063/1.1900316DOI
Keywords:
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Petra Wild
Deposited On:10 Jul 2012 14:12
Last Modified:10 Oct 2012 09:29
Item ID:25324
Owner Only: item control page
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