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Schwarz, Uli and Schuck, P. and Mason, M. and Grober, R. and Roskowsky, A. and Einfeldt, S. and Davis, R. (2003) Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC. Physical Review B 67, p. 45321.
Roskowsky, A. and Miraglia, P. and Preble, E. and Einfeldt, S. and Stiles, T. and Davis, R. and Schuck, J. and Grober, R. and Schwarz, Uli (2001) Strain and dislocation reduction in maskless pendeo-epitaxy GaN thin films. phys. stat. sol. (a) 188, p. 729.