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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-253411
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25341
Alternative Links zum Volltext:DOI
Zusammenfassung
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7 × 7) surface is studied ...
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