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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-25795
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.2579
Zusammenfassung
We present a detailed microphotoluminescence study of the long-range strain fields surrounding threading dislocations as well as their interaction and pattern formation in GaN bulk crystals. The stress patterns are detected by tiny energy shifts of the near-band-edge spectral lines and show a dipolelike stress state around the dislocation core of edge- or mixed-type dislocations, with an angular ...
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