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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-440317
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.44031
Zusammenfassung
Traditionally, atomic force microscopy (AFM) experiments are conducted at tip-sample distances where the tip strongly interacts with the surface. This increases the signal-to-noise ratio, but poses the problem of relaxations in both tip and sample that hamper the theoretical description of experimental data. Here, we employ AFM at relatively large tip-sample distances where forces are only on the ...
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