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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-747683
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.74768
Zusammenfassung
The qPlus sensor allows for the simultaneous operation of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). When operating a combined qPlus sensor STM/AFM at large tunneling currents, a hitherto unexplained tunneling current-induced cross coupling can occur, which has already been observed decades ago. Here, we study this phenomenon both theoretically and experimentally; its ...

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