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2000
Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen
(2000)
Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy.
Science 289 (5478), S. 422-425.
Giessibl, Franz J. und Bielefeldt, Hartmut
(2000)
Physical interpretation of frequency-modulation atomic force microscopy.
Physical Review B (PRB) 61 (15), S. 9968-9971.
Giessibl, Franz J.
(2000)
Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork.
Applied Physics Letters 76 (11), S. 1470-1472.