["viewname_eprint_historical_projects_date" not defined]

Giessibl, Franz J. (2005) AFM's path to atomic resolution. Materials Today 8 (5), S. 32-41.

Giessibl, Franz J. und Reichling, Michael (2005) Investigating atomic details of the CaF₂(111) surface with a qPlus sensor. Nanotechnology 16 (3), S. 118-124.

Herz, Markus, Schiller, Christian H., Giessibl, Franz J. und Mannhart, Jochen (2005) Simultaneous current-, force-, and work-function measurement with atomic resolution. Applied Physics Letters 86 (15), 153101-1-153101-3.

Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F. (2005) Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite. Physical Review Letters (PRL) 94 (5), 056101-1-056101-4.