Entries of Fuhrer, Andreas on the publication server

Lüscher, Silvia, Held, Ryan, Fuhrer, Andreas, Heinzel, Thomas, Ensslin, Klaus, Bichler, Max and Wegscheider, Werner (2001) Electronic properties of AFM-defined semiconductor nanostructures. Materials Science and Engineering C 15 (1-2), pp. 153-157. Fulltext restricted.

Lüscher, Silvia, Fuhrer, Andreas, Heinzel, Thomas, Ensslin, Klaus, Wegscheider, Werner and Bichler, Max (2001) Spin effects in quantum dots with steep potential walls. In: Electronic correlations: from meso- to nano-physics; proceedings of the XXXVIth Rencontres de Moriond, Les Arces, France, January 20-27, 2001. Moriond workshops (Series). EDP Sciences, Les Ulis, p. 367. ISBN 2-86883-570-8. Fulltext not available.

Fuhrer, Andreas, Lüscher, Silvia, Heinzel, Thomas, Ihn, Thomas, Ensslin, Klaus, Wegscheider, Werner and Bichler, Max (2001) h/e-periodic oscillations of conductance peak height and position in quantum rings in the coulomb blockade regime. In: 14th International Conference on the Electronic Properties of Two-Dimensional Systems, 30. Juli - 3. August 2001, Prag, Tschechien. Fulltext not available.

Heinzel, Thomas, Lüscher, Silvia, Held, Ryan, Fuhrer, Andreas, Ensslin, Klaus, Wegscheider, Werner and Bichler, Max (2000) Electronic Properties of Semiconductor Nanostructures patterned by AFM Lithography. In: 11th International Winterschool on New Developments in Solid State Physics, 21.-25. Februar 2000, Mauterndorf, Österreich. Fulltext not available.

Lüscher, Silvia, Held, Ryan, Fuhrer, Andreas, Heinzel, Thomas, Ensslin, Klaus, Bichler, Max and Wegscheider, Werner (2000) Electronic properties of AFM-defined semiconductor nanostructures: quantum wires and single electron transistors. In: International Workshop on the Physics of Low Dimensions, 16.-20. Janurar 2000, Oaxaca, Mexiko. Fulltext not available.

Heinzel, Thomas, Lüscher, Silvia, Fuhrer, Andreas, Salis, Gian, Held, Ryan, Ensslin, Klaus and Wegscheider, Werner (2000) Nano-oxidation of semiconductor heterostructures with atomic force microscopes: technology and applications. In: Andrews, David L. and Asakura, Toshimitsu and Jutamulia, Suganda and Kirk, Wiley P. and Lagally, Max G. and Lal, Ravindra B. and Trolinger, James D., (eds.) Optical devices and diagnostics in materials science: 1-4 August2000, San Diego, USA. SPIE proceedings series, 4098. Society of Photo-Optical Instrumentation Engineers, Bellingham, Washington, p. 52. ISBN 0-8194-3743-3. Fulltext not available.