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Publications by Jeon, D.
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Giessibl, Franz J.
(1999)
Force Microscopy in Vacuum with Atomic Resolution.
In: Kuk, Y. and Lyo, I. W. and Jeon, D. and Park, S. I., (eds.)
Preliminary proceedings of STM : 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy ; 19 - 23 July, 1999, Seoul, Korea.
, pp. 19-20.
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