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2016
Mohajerani, M. S., Khachadorian, S., Schimpke, T., Nenstiel, C., Hartmann, J., Ledig, J., Avramescu, A., Strassburg, M., Hoffmann, A. and Waag, A.
(2016)
Evaluation of local free carrier concentrations in individual heavily-doped GaN:Si micro-rods by micro-Raman spectroscopy.
Applied Physics Letters 108 (9), 091112.
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