Number of items: 4.
2002
2000
Ganslmeier, B.,
Schels, A. and
Lang, Elmar W.
(2000)
PCA and ICA analysis of process control data obtained during si-wafer manufacturing.
In:
Hamza, M. H., (ed.)
Signal processing and communications: proceedings of the IASTED international conference (SPC), September 19 - 22, 2000, Marbella, Spain.
IASTED/Acta Press, Anaheim, pp. 72-77.
ISBN 0-88986-302-4.
Fulltext not available.
1995
Stetter, M.,
Kussinger, M.,
Schels, A.,
Seeger, E. and
Lang, Elmar
(1995)
Self-organization of cortical receptive fields and columnar structures in a hebb-trained neural network.
In:
Mira, José, (ed.)
From natural to artificial neural computation; proceedings of the International Workshop on Artificial Neural Networks (IWANN '95), Malaga-Torremolinos, Spain, June 7 - 9.
Lecture notes in computer science, 930.
Springer, Berlin, pp. 37-44.
ISBN 3-540-59497-3; 0-387-59497-3 (print und e-book).
Fulltext not available.
This list was generated on Wed Nov 13 12:40:53 2024 CET.