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Number of items: 4.

2002

Schels, A., Leim, D. and Lang, Elmar (2002) Neural network models for error classification and manufacturing yield forecast. In: Proc. of Int. Conf. Modelling and Analysis of Semiconductor Manufacturing (MASM), Tempe, Arizona, 2002. , pp. 296-301. Fulltext not available.

2000

Ganslmeier, B., Schels, A. and Lang, Elmar W. (2000) PCA and ICA analysis of process control data obtained during si-wafer manufacturing. In: Hamza, M. H., (ed.) Signal processing and communications: proceedings of the IASTED international conference (SPC), September 19 - 22, 2000, Marbella, Spain. IASTED/Acta Press, Anaheim, pp. 72-77. ISBN 0-88986-302-4. Fulltext not available.

1995

Stetter, M., Schels, A. and Lang, Elmar (1995) Prenatal self-organization of orientation maps simulated in a neural network. In: Elsner, Norbert and Menzel, R., (eds.) Learning and memory. Proceedings of the 23th Göttingen Neurobiology Conference 1995. vol. 1. Thieme, Stuttgart. ISBN 3-13-101881-X. Fulltext not available.

Stetter, M., Kussinger, M., Schels, A., Seeger, E. and Lang, Elmar (1995) Self-organization of cortical receptive fields and columnar structures in a hebb-trained neural network. In: Mira, José, (ed.) From natural to artificial neural computation; proceedings of the International Workshop on Artificial Neural Networks (IWANN '95), Malaga-Torremolinos, Spain, June 7 - 9. Lecture notes in computer science, 930. Springer, Berlin, pp. 37-44. ISBN 3-540-59497-3; 0-387-59497-3 (print und e-book). Fulltext not available.

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