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Jump to: 2012
Number of items: 2.

2012

Rosenauer, A., Müller, K., Mehrtens, T., Schowalter, M., Zweck, Josef, Fritz, R. and Volz, K. (2012) Measurement of Composition and Strain by STEM. Microscopy and Microanalysis 18 Supl.2, pp. 1804-0815.

Müller, K., Rosenauer, A., Schowalter, M., Zweck, Josef, Fritz, R. and Volz, K. (2012) Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy. Microscopy and Microanalysis 18, pp. 995-1009.

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