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Article
Eberl, Karl and Wegscheider, Werner and Abstreiter, Gerhard and Cerva, H. and Oppolzer, H. (1991) Symmetry properties of short period (001) Si/Ge superlattices. Superlattices and Microstructures 9 (1), pp. 31-33.
Wegscheider, Werner and Eberl, Karl and Abstreiter, Gerhard and Cerva, H. and Oppolzer, H. (1990) Novel relaxation process in strained Si/Ge superlattices grown on Ge (001). Applied Physics Letters 57 (15), pp. 1496-1498.
Wegscheider, Werner and Eberl, Karl and Cerva, H. and Oppolzer, H. (1989) Transmission electron microscopy of short-period Si/Ge strained-layer superlattices on Ge substrates. Applied Physics Letters 55 (5), p. 448.
Book Section
Wegscheider, Werner and Eberl, Karl and Abstreiter, Gerhard and Cerva, Hans and Oppolzer, H. (1991) High-Resolution Imaging of Twin Intersections in Si/Ge Superlattices on Ge(001) Substrates. In: Cullis, Anthony G., (ed.) Microscopy of semiconducting materials 1991. Conference series, 117. Institute of Physics, Bristol, p. 21. ISBN 0-85498-406-2.