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Rosenauer, A., Müller, K., Mehrtens, T., Schowalter, M., Zweck, Josef, Fritz, R. and Volz, K. (2012) Measurement of Composition and Strain by STEM. Microscopy and Microanalysis 18 Supl.2, pp. 1804-0815.

Müller, K., Rosenauer, A. , Schowalter, M., Zweck, Josef, Fritz, R. and Volz, K. (2012) Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy. Microscopy and Microanalysis 18, pp. 995-1009.

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