Entries of Fritz, R. on the publication server
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Number of items: 2.
Rosenauer, A., Müller, K., Mehrtens, T., Schowalter, M., Zweck, Josef, Fritz, R. and Volz, K.
(2012)
Measurement of Composition and Strain by STEM.
Microscopy and Microanalysis 18 Supl.2, pp. 1804-0815.
Müller, K., Rosenauer, A.
, Schowalter, M., Zweck, Josef, Fritz, R. and Volz, K.
(2012)
Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy.
Microscopy and Microanalysis 18, pp. 995-1009.
