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Jump to: 2012 | 2009 | 2008 | 2007 | 2004 | 2003 | 2001
Number of items: 8.

2012

Gareev, R. R., Schmid, M., Vancea, Johann, Back, C. H. , Schreiber, Rainer, Bürgler, D. , Schneider, C. M. , Stromberg, F. and Wende, Heiko (2012) Antiferromagnetic coupling across silicon regulated by tunneling currents. Applied Physics Letters.

2009

Heindl, Emanuel, Kefes, Christoph, Soda, Marcello, Vancea, Johann and Back, Christian (2009) Hot electron spin attenuation lengths of bcc Fe34Co66—Room temperature Magnetocurrent of 1200%. Journal of Magnetism and Magnetic Materials 321 (22), p. 3693. Fulltext not available.

2008

Stetter, Andreas, Vancea, Johann and Back, Christian (2008) Determination of the intershell conductance in a multiwall carbon nanotube. Applied Physics Letters 93, p. 172103. Fulltext not available.

2007

Heindl, Emanuel, Vancea, Johann and Back, Christian (2007) Ballistic electron magnetic microscopy on epitaxial spin valves. Physical Review B (PRB) 75, 073307. Fulltext restricted.

Heindl, Emanuel, Vancea, Johann, Woltersdorf, Georg and Back, Christian (2007) Hot-electron transport and magnetic anisotropy in epitaxial spin valves. Physical Review B (PRB) 76, p. 104435.

2004

Liu, Dongping, Benstetter, Günther, Lodermeier, Edgar, Zhang, Jialiang, Liu, Yanhong and Vancea, Johann (2004) Filtered pulsed carbon cathodic arc: Plasma and amorphous carbon properties. Journal of Applied Physics 95 (12), pp. 7624-7631. Fulltext not available.

2003

Liu, Dongping, Benstetter, Günther, Lodermeier, Edgar and Vancea, Johann (2003) Influence of the incident angle of energetic carbon ions on the properties of tetrahedral amorphous carbon (ta-C) films. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 21 (5), pp. 1665-1670. Fulltext not available.

2001

Olbrich, Alexander, Ebersberger, Bernd, Boit, Christian, Vancea, Johann, Hoffmann, Horst, Altmann, Hans, Gieres, Guenther and Wecker, Joachim (2001) Oxide thickness mapping of ultrathin Al2O3 at nanometer scale with conducting atomic force microscopy. Applied Physics Letters 78 (19), pp. 2934-2936. Fulltext not available.

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