Anzahl der Einträge: 5.
Kirpal, Dominik,
Qiu, Jinglan ,
Pürckhauer, Korbinian,
Weymouth, Alfred J. ,
Metz, Michael und
Giessibl, Franz J.
(2021)
Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes.
Review of Scientific Instruments 92 (4), 043703.
Ooe, Hiroaki,
Kirpal, Dominik,
Wastl, Daniel S.,
Weymouth, Alfred J. ,
Toyoko, Arai und
Giessibl, Franz J.
(2016)
Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy.
Applied Physics Letters 109, S. 141603.
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