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Number of items: 7.


Weymouth, Alfred J. and Meuer, Daniel and Mutombo, Pingo and Wutscher, Thorsten and Ondracek, Martin and Jelinek, Pavel and Giessibl, Franz J. (2013) Atomic Structure Affects the Directional Dependence of Friction. Physical Review Letters 111 (12), p. 126103. Fulltext not available.

Wutscher, Thorsten and Niebauer, Johannes and Giessibl, Franz J. (2013) Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers. Review of Scientific Instruments 84, 073704-1.

Wutscher, Thorsten (2013) Untersuchung der Kopplung von atomaren Strömen und atomaren Kräften durch die Rastersondenmikroskopie. PhD, Universität Regensburg.


Wutscher, Thorsten and Weymouth, Alfred J. and Giessibl, Franz J. (2012) Localization of the phantom force induced by the tunneling current. Physical Review B (PRB) 85 (19), 195426-1-195426-6.


Weymouth, Alfred J. and Wutscher, Thorsten and Welker, Joachim and Hofman, Thomas and Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). Physical Review Letters (PRL) 106 (22), 226801-1-226801-4.

Wutscher, Thorsten and Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. Review of Scientific Instruments 82 (2), 026106.


Tung, Raimond C. and Wutscher, Thorsten and Martinez-Martin, David and Reifenberger, Ronald G. and Giessibl, Franz J. and Raman, Arvind (2010) Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy. Journal of Applied Physics 107 (10), 104508-1-104508-8.

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