Einträge von Hembacher, Stefan auf dem Publikationsserver
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Anzahl der Einträge: 9.
2005
Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F.
(2005)
Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite.
Physical Review Letters (PRL) 94 (5), 056101-1-056101-4.
2004
Hembacher, Stefan, Giessibl, Franz J. und Mannhart, Jochen
(2004)
Force Microscopy with Light-Atom Probes.
Science 305 (5682), S. 380-383.
Giessibl, Franz J., Hembacher, Stefan, Herz, Markus, Schiller, C. H. und Mannhart, Jochen
(2004)
Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor.
Nanotechnology 15 (2), S. 79-86.
2003
Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F.
(2003)
Revealing the hidden atom in graphite by low-temperature atomic force microscopy.
Proceedings of the National Academy of Sciences of the United States of America (PNAS) 100 (22), S. 12539-12542.
2002
Hembacher, Stefan, Giessibl, Franz J. und Mannhart, Jochen
(2002)
Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum.
Applied Surface Science 188 (3-4), S. 445-449.
2001
Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan und Mannhart, Jochen
(2001)
Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations.
Annalen der Physik 10 (11-12), S. 887-910.
Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen
(2001)
Imaging silicon by atomic force microscopy with crystallographically oriented tips.
Applied Physics A: Materials Science & Processing 72 (Suppl1), S. 15-17.
2000
Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen
(2000)
Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy.
Science 289 (5478), S. 422-425.
1999
Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan und Mannhart, Jochen
(1999)
Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy.
Applied Surface Science 140 (3-4), S. 352-357.