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Publications by Welker, Joachim

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Number of items: 9.


Emmrich, Matthias, Huber, Ferdinand, Pielmeier, Florian, Welker, Joachim, Hofmann, Thomas, Schneiderbauer, Maximilian, Meuer, Daniel, Polesya, Svitlana, Mankovsky, Sergiy, Koedderitzsch, Diemo, Ebert, Hubert and Giessibl, Franz J. (2015) Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters. SCIENCE 348 (6232), pp. 308-311.


Welker, Joachim, Weymouth, Alfred J. and Giessibl, Franz J. (2013) The Influence of Chemical Bonding Configuration on Atomic Identification by Force Spectroscopy. ACS NANO 7 (8), pp. 7377-7382. Fulltext not available.

Welker, Joachim (2013) Höchstauflösende Kraftmikroskopie mit subatomar definierten Bindungszuständen. Dissertationsreihe der Fakultät für Physik der Universität Regensburg 30, PhD, Universität Regensburg.

Welker, Joachim and Giessibl, Franz J. (2013) Abbildung der Symmetrien chemischer Bindungen. , Regensburg.


Welker, Joachim and Giessibl, Franz J. (2012) Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy. Science 336 (608), pp. 444-449.

Welker, Joachim, Illek, Esther and Giessibl, Franz J. (2012) Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy. Beilstein Journal of Nanotechnology 3, pp. 238-248.


Weymouth, Alfred J., Wutscher, Thorsten, Welker, Joachim, Hofman, Thomas and Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). Physical Review Letters (PRL) 106 (22), 226801-1-226801-4.

Welker, Joachim, de Faria Elsner, Frederico and Giessibl, Franz J. (2011) Application of the equipartition theorem to the thermal excitation of quartz tuning forks. Applied Physics Letters 99, 084102.


Hofmann, Thomas, Welker, Joachim and Giessibl, Franz J. (2010) Preparation of light-atom tips for scanning probe microscopy by explosive delamination. Journal of Vacuum Science & Technology B 28 (3), C4E28-C4E30.

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