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Plechinger, Gerd and Castellanos-Gomez, Andres and Buscema, Michele and van der Zant, Herre S. J. and Steele, Gary A. and Kuc, Agnieszka and Heine, Thomas and Schueller, Christian and Korn, Tobias (2015) Control of biaxial strain in singel-layer MoS2 using local thermal expansion of the substrate. 2D Materials (2DM) 2 (1), 015006. Fulltext not available.

Plechinger, Gerd and Mann, J. and Preciado, E. and Barroso, D. and Nguyen, A. and Eroms, Jonathan and Schueller, Christian and Bartels, Ludwig and Korn, Tobias (2014) A direct comparison of CVD-grown and exfoliated MoS2 using optical spectroscopy. Semiconductor Science and Technology 29 (6), 064008.
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Plechinger, Gerd and Heydrich, Stefanie and Eroms, Jonathan and Weiss, Dieter and Schüller, Christian and Korn, Tobias (2012) Raman spectroscopy of the interlayer shear mode in few-layer MoS2 flakes. AIP | Applied Physics Letters.
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Plechinger, Gerd and Schrettenbrunner, Franz-Xaver and Eroms, Jonathan and Weiss, Dieter and Schueller, Christian and Korn, Tobias (2012) Low-temperature photoluminescence of oxide-covered single-layer MoS2. Phys. Status Solidi RRL 6 (3), pp. 126-128. Fulltext not available.

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