Anzahl der Einträge: 20.
2024
Nam, Shinjae,
Riegel, Elisabeth,
Hörmann, Lukas,
Hofmann, Oliver T.,
Gretz, Oliver ,
Weymouth, Alfred J. und
Giessibl, Franz J.
(2024)
Exploring in-plane interactions beside an adsorbed molecule with lateral force microscopy.
Applied Physical Sciences - PNAS 121 (2).
Volltext nicht vorhanden.
2023
2022
Hofmann, Thomas P.,
Ren, Xinguo ,
Weymouth, Alfred J. ,
Meuer, Daniel,
Liebig, Alexander ,
Donarini, Andrea und
Giessibl, Franz J.
(2022)
Evidence for temporary and local transition of sp2 graphite-type to sp3 diamond-type bonding induced by the tip of an atomic force microscope.
New Journal of Physics 24 (083018).
2021
Kirpal, Dominik,
Qiu, Jinglan ,
Pürckhauer, Korbinian,
Weymouth, Alfred J. ,
Metz, Michael und
Giessibl, Franz J.
(2021)
Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes.
Review of Scientific Instruments 92 (4), 043703.
2020
Weymouth, Alfred J. ,
Riegel, Elisabeth,
Gretz, Oliver und
Giessibl, Franz J.
(2020)
Strumming a Single Chemical Bond.
Physical Review Letters 124 (19).
Volltext nicht vorhanden.
2019
2018
Pürckhauer, Korbinian,
Weymouth, Alfred J. ,
Pfeffer, Katharina,
Kullmann, Lars,
Mulvihill, Estefania,
Krahn, Michael P. ,
Müller, Daniel J. und
Giessibl, Franz J.
(2018)
Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors.
Scientific Reports 8 (1), S. 9330.
2017
2016
Ooe, Hiroaki,
Kirpal, Dominik,
Wastl, Daniel S.,
Weymouth, Alfred J. ,
Toyoko, Arai und
Giessibl, Franz J.
(2016)
Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy.
Applied Physics Letters 109, S. 141603.
Diese Liste wurde erzeugt am Tue May 28 18:31:43 2024 CEST.