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Schneiderbauer, Maximilian and Emmrich, Matthias and Weymouth, Alfred J. and Giessibl, Franz J. (2014) CO Tip Functionalization Inverts Atomic Force Microscopy
Contrast via Short-Range Electrostatic Forces.
Physical Review Letters (PRL) 112, pp. 166102-1.

Weymouth, Alfred J. and Hofmann, Thomas and Giessibl, Franz J. (2014) Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy. Science.

Weymouth, Alfred J. and Meuer, Daniel and Mutombo, Pingo and Wutscher, Thorsten and Ondracek, Martin and Jelinek, Pavel and Giessibl, Franz J. (2013) Atomic Structure Affects the Directional Dependence of Friction. Physical Review Letters 111 (12), p. 126103.

Wastl, Daniel S. and Weymouth, Alfred J. and Giessibl, Franz J. (2013) Optimizing atomic resolution of force microscopy in ambient conditions. Physical Review B (PRB) 87 (24), p. 245415.

Wutscher, Thorsten and Weymouth, Alfred J. and Giessibl, Franz J. (2012) Localization of the phantom force induced by the tunneling current. Physical Review B (PRB) 85 (19), p. 195426.

Weymouth, Alfred J. and Wutscher, Thorsten and Welker, Joachim and Hofman, Thomas and Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). Physical Review Letters (PRL) 106 (22), p. 226801.

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