Einträge von Giessibl, Franz J. auf dem Publikationsserver

Giessibl, Franz J. und Weymouth, Alfred J. (2024) Decoding the surface of a complex oxide. Science 385 (6714), S. 1166-1167. Volltext nicht vorhanden.

Giessibl, Franz J. (2024) Atomic force microscopy with qPlus sensors. MRS Bulletin 49, S. 492-502.

Pietanesi, Laura, Marganska, Magdalena , Mayer, Thomas, Barth, Michael , Chen, Lin, Zou, Ji, Weindl, Adrian , Liebig, Alexander , Diaz-Pardo, Rebeca, Suri, Dhavala , Schmid, Florian, Giessibl, Franz J. , Richter, Klaus , Tserkovnyak, Yaroslav, Kronseder, Matthias und Back, Christian H. (2024) Tracing Dirac points of topological surface states by ferromagnetic resonance. Phys. Rev. B 109 (6), 064424.

Nam, Shinjae, Riegel, Elisabeth, Hörmann, Lukas, Hofmann, Oliver T., Gretz, Oliver , Weymouth, Alfred J. und Giessibl, Franz J. (2024) Exploring in-plane interactions beside an adsorbed molecule with lateral force microscopy. Applied Physical Sciences - PNAS 121 (2). Volltext nicht vorhanden.

Auer, Andrea , Eder, Bernhard und Giessibl, Franz J. (2023) Electrochemical AFM/STM with a qPlus sensor: A versatile tool to study solid-liquid interfaces. The Journal of Chemical Physics (159), S. 174201.

Okabayashi, Norio, Frederiksen, Thomas , Liebig, Alexander und Giessibl, Franz J. (2023) Dynamic Friction Unraveled by Observing an Unexpected Intermediate State in Controlled Molecular Manipulation. Physical Review Letters 131 (14), S. 148001.

Okabayashi, Norio, Frederiksen, Thomas , Liebig, Alexander und Giessibl, Franz J. (2023) Energy dissipation of a carbon monoxide molecule manipulated using a metallic tip on copper surfaces. Physical Review B 108, S. 165401.

Weymouth, Alfred J. , Roche, Emily und Giessibl, Franz J. (2022) From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111). Beilstein J. Nanotechnol., S. 1572-1577.

Liebig, Alexander , Setescak, Christoph, Weindl, Adrian und Giessibl, Franz J. (2022) Structural Characterization of Defects in the Topological Insulator Bi2Se3 at the Picometer Scale. J. Phys. Chem. C 126, S. 21716-21722. Volltext nicht vorhanden.

Hofmann, Thomas P., Ren, Xinguo , Weymouth, Alfred J. , Meuer, Daniel, Liebig, Alexander , Donarini, Andrea und Giessibl, Franz J. (2022) Evidence for temporary and local transition of sp2 graphite-type to sp3 diamond-type bonding induced by the tip of an atomic force microscope. New Journal of Physics 24 (083018).

Weymouth, Alfred J. , Gretz, Oliver , Riegel, Elisabeth und Giessibl, Franz J. (2022) Measuring sliding friction at the atomic scale. Japanese Journal of Applied Physics 61 (SL), SL0801.

Weymouth, Alfred J. , Persson, Mats und Giessibl, Franz J. (2022) Revealing buckling of an apparently flat monolayer of NaCl on Pt(111). Physical Review B 105, 035412.

Giessibl, Franz J. (2021) Probing the Nature of Chemical Bonds by Atomic Force Microscopy. Molecules 26 (13), S. 4068.

Stilp, Fabian , Bereczuk, Andreas , Berwanger, Julian , Mundigl, Nadine , Richter, Klaus und Giessibl, Franz J. (2021) Very weak bonds to artificial atoms formed by quantum corrals. Science 372 (6547), S. 1196-1200. Volltext nicht vorhanden.

Gretz, Oliver , Weymouth, Alfred J. , Holzmann, Thomas, Pürckhauer, Korbinian und Giessibl, Franz J. (2021) Determining amplitude and tilt of a lateral force microscopy sensor. Beilstein J. Nanotechnol (12), S. 517-524.

Kim, Sungmin , Schwenk, Johannes , Walkup, Daniel , Zeng, Yihang, Ghahari, Fereshte, Le, Son T., Slot, Marlou R. , Berwanger, Julian , Blankenship, Steven R., Watanabe, Kenji , Taniguchi, Takashi, Giessibl, Franz J., Zhitenev, Nikolai B., Dean, Cory R. und Stroscio, Joseph A. (2021) Edge channels of broken-symmetry quantum Hall states in graphene visualized by atomic force microscopy. Nature Communications 12, S. 2852.

Kirpal, Dominik, Qiu, Jinglan , Pürckhauer, Korbinian, Weymouth, Alfred J. , Metz, Michael und Giessibl, Franz J. (2021) Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes. Review of Scientific Instruments 92 (4), 043703.

Weymouth, Alfred J. , Riegel, Elisabeth, Simmet, Bianca, Gretz, Oliver und Giessibl, Franz J. (2021) Lateral Force Microscopy Reveals the Energy Barrier of a Molecular Switch. ACS Nano 15 (2), S. 3264-3271. Volltext nicht vorhanden.

Liebig, Alexander, Hapala, Prokop , Weymouth, Alfred J. und Giessibl, Franz J. (2020) Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip. Scientific Reports 10, S. 14104.

Gretz, Oliver , Weymouth, Alfred J. und Giessibl, Franz J. (2020) Identifying the atomic configuration of the tip apex using STM and frequency-modulation AFM with CO on Pt(111). Physical Review Research 2, 033094.

Berwanger, Julian , Polesya, Svitlana, Mankovsky, Sergiy, Ebert, Hubert und Giessibl, Franz J. (2020) Atomically Resolved Chemical Reactivity of Small Fe Clusters. Physical Review Letters 124, 096001.

Schwenk, Johannes, Kim, Sungmin , Berwanger, Julian, Ghahari, Fereshte, Walkup, Daniel, Slot, Marlou R., Le, Son T., Cullen, William G., Blankenship, Steven R., Vranjkovic, Sasa, Hug, Hans J., Kuk, Young, Giessibl, Franz J. und Stroscio, Joseph A. (2020) Achieving μeV tunneling resolution in an in-operando scanning tunneling microscopy, atomic force microscopy, and magnetotransport system for quantum materials research. Review of Scientific Instruments 91 (7), 071101. Volltext nicht vorhanden.

Pürckhauer, Korbinian, Maier, Simon, Merkel, Anja, Kirpal, Dominik und Giessibl, Franz J. (2020) Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions. Review of Scientific Instruments 91 (8), 083701. Volltext nicht vorhanden.

Huber, Ferdinand und Giessibl, Franz J. (2020) Experimental use of the inflection point test for force deconvolution in frequency-modulation atomic force microscopy to turn an ill-posed situation into a well-posed one by proper choice of amplitude. Journal of Applied Physics 127 (18), S. 184301. Volltext nicht vorhanden.

Weymouth, Alfred J. , Riegel, Elisabeth, Gretz, Oliver und Giessibl, Franz J. (2020) Strumming a Single Chemical Bond. Physical Review Letters 124 (19). Volltext nicht vorhanden.

Huber, Ferdinand , Berwanger, Julian , Polesya, Svitlana, Mankovsky, Sergiy, Ebert, Hubert und Giessibl, Franz J. (2019) Chemical bond formation showing a transition from physisorption to chemisorption. Science 366 (6462), S. 235-238. Volltext nicht vorhanden.

Rugar, Daniel und Giessibl, Franz J. (2019) Calvin F. Quate (1923–2019). Science 365 (6455), S. 760. Volltext nicht vorhanden.

Seeholzer, Theresa, Gretz, Oliver, Giessibl, Franz J. und Weymouth, Alfred J. (2019) A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data. New Journal of Physics 21 (8), 083007.

Pürckhauer, Korbinian, Kirpal, Dominik, Weymouth, Alfred J. und Giessibl, Franz J. (2019) Analysis of Airborne Contamination on Transition Metal Dichalcogenides with Atomic Force Microscopy Revealing That Sulfur Is the Preferred Chalcogen Atom for Devices Made in Ambient Conditions. ACS Applied Nano Materials 2 (5), S. 2593-2598. Volltext nicht vorhanden.

Liebig, Alexander und Giessibl, Franz J. (2019) In-situ characterization of O-terminated Cu tips for high-resolution atomic force microscopy. Applied Physics Letters 114, S. 143103.

Giessibl, Franz J. (2019) The qPlus sensor, a powerful core for the atomic force microscope. Review of Scientific Instruments (90), 011101.

Rehmann, Mirko K., Kalyoncu, Yemliha B., Kisiel, Marcin, Pascher, Nikola, Giessibl, Franz J. , Müller, Fabian, Watanabe, Kenji , Taniguchi, Takashi, Meyer, Ernst, Liu, Ming-Hao und Zumbühl, Dominik M. (2019) Characterization of hydrogen plasma defined graphene edges. Carbon 150, S. 417-424. Volltext nicht vorhanden.

Kirpal, Dominik J., Pürckhauer, Korbinian, Weymouth, Alfred J. und Giessibl, Franz J. (2019) Ion mobility and material transport on KBr in air as a function of the relative humidity. Beilstein Journal of Nanotechnology 10, S. 2084-2093. Volltext nicht vorhanden.

Sader, John E., Hughes, Barry D. , Huber, Ferdinand und Giessibl, Franz J. (2018) Interatomic force laws that evade dynamic measurement. Nature Nanotechnology 13 (12), S. 1088. Volltext nicht vorhanden.

Berwanger, Julian , Huber, Ferdinand , Stilp, Fabian und Giessibl, Franz J. (2018) Lateral manipulation of single iron adatoms by means of combined atomic force and scanning tunneling microscopy using CO-terminated tips. Physical Review B (PRB) 98 (19), S. 195409.

Weymouth, Alfred J., Wastl, Daniel S. und Giessibl, Franz J. (2018) Advances in AFM: Seeing Atoms in Ambient Conditions. e-Journal of Surface Science and Nanotechnology 16, S. 351-355.

Pürckhauer, Korbinian, Weymouth, Alfred J. , Pfeffer, Katharina, Kullmann, Lars, Mulvihill, Estefania, Krahn, Michael P. , Müller, Daniel J. und Giessibl, Franz J. (2018) Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors. Scientific Reports 8 (1), S. 9330.

Weymouth, Alfred J. , Riegel, Elisabeth, Matencio, Sonia und Giessibl, Franz J. (2018) Evaluating the potential energy landscape over single molecules at room temperature with lateral force microscopy. Applied Physics Letters 112 (18), S. 181601. Volltext nicht vorhanden.

Okabayashi, Norio, Peronio, Angelo , Paulsson, Magnus, Arai, Toyoko und Giessibl, Franz J. (2018) Vibrations of a molecule in an external force field. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 115 (18), S. 4571-4576. Volltext nicht vorhanden.

Gustafsson, Alexander, Okabayashi, Norio, Peronio, Angelo, Giessibl, Franz J. und Paulsson, Magnus (2017) Analysis of STM images with pure and CO-functionalized tips: A first-principles and experimental study. Physical Review B 96 (8).

Huber, Ferdinand und Giessibl, Franz J. (2017) Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperatures. Review of Scientific Instruments 88 (7), 073702. Volltext nicht vorhanden.

Peronio, Angelo und Giessibl, Franz J. (2016) Attempts to test an alternative electrodynamic theory of superconductors by low-temperature scanning tunneling and atomic force microscopy. Physical Review B (PRB) 94 (094503), 094503.

Ooe, Hiroaki, Kirpal, Dominik, Wastl, Daniel S., Weymouth, Alfred J. , Toyoko, Arai und Giessibl, Franz J. (2016) Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy. Applied Physics Letters 109, S. 141603.

Okobayashi, Norio, Gustafsson, Alexander, Peronio, Angelo , Paulsson, Magnus, Arai, Toyoko und Giessibl, Franz J. (2016) Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density functional theory. Physical Review B (PRB) 93, S. 165415-1.

Huber, Ferdinand, Matencio, Sonia, Weymouth, Alfred J., Ocal, Carmen, Barrena, Esther und Giessibl, Franz J. (2015) Intramolecular Force Contrast and Dynamic Current-Distance Measurements at Room Temperature. Physical Review Letters 115 (6), 066101-1-066101-4.

Emmrich, Matthias, Huber, Ferdinand, Pielmeier, Florian, Welker, Joachim, Hofmann, Thomas, Schneiderbauer, Maximilian, Meuer, Daniel, Polesya, Svitlana, Mankovsky, Sergiy, Koedderitzsch, Diemo, Ebert, Hubert und Giessibl, Franz J. (2015) Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters. SCIENCE 348 (6232), S. 308-311.

Emmrich, Matthias, Schneiderbauer, Maximilian, Huber, Ferdinand, Weymouth, Alfred J., Okabayashi, Norio und Giessibl, Franz J. (2015) Force Field Analysis Suggests a Lowering of Diffusion Barriers in Atomic Manipulation Due to Presence of STM Tip. Physical Review Letters (PRL) 114, 146101-146101-5.

Wastl, Daniel S., Judmann, Michael, Weymouth, Alfred J. und Giessibl, Franz J. (2015) Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips. ACS Nano 9 (4), S. 3858-3865. Volltext nicht vorhanden.

Wurster, Eva-Christina, Liebl, Renate, Michaelis, Stefanie, Robelek, Rudolf, Wastl, Daniel S., Giessibl, Franz J., Goepferich, Achim und Breunig, Miriam (2015) Oligolayer-Coated Nanoparticles: Impact of Surface Topography at the Nanobio Interface. ACS applied materials & interfaces 7, S. 7891-7900. Volltext nicht vorhanden.

Pielmeier, Florian, Landolt, Gabriel, Slomski, Bartosz, Muff, Stefan, Berwanger, Julian, Eich, Andreas, Khajetoorians, Alexander A., Wiebe, Jens, Aliev, Ziya S., Babanly, Mahammad B., Wiesendanger, Roland, Osterwalder, Jürg, Chulkov, Evgueni V., Giessibl, Franz J. und Dil, J. Hugo (2015) Response of the topological surface state to surface disorder in TIBiSe2. New Journal of Physics 17, 023067.

Ionescu, Andrei, Brambilla, Eugenio, Wastl, Daniel S., Giessibl, Franz J., Cazzaniga, Gloria, Schneider-Feyrer, Sibylle und Hahnel, Sebastian (2015) Influence of matrix and filler fraction on biofilm formation on the surface of experimental resin-based composites. Journal of Materials Science: Materials in Medicine 26, S. 58. Volltext nicht vorhanden.

Hahnel, Sebastian, Wastl, Daniel S., Schneider-Feyrer, Sibylle, Giessibl, Franz J., Brambilla, Eugenio, Cazzaniga, Gloria und Ionescu, Andrei (2014) Streptococcus mutans biofilm formation and release of fluoride from experimental resin-based composites depending on surface treatment and S-PRG filler particle fraction. The journal of adhesive dentistry (JAD) 16 (4), S. 313-321. Volltext nicht vorhanden.

Neu, Mathias, Moll, Nikolaj, Gross, Leo, Meyer, Gerhard, Giessibl, Franz J. und Repp, Jascha (2014) Image correction for atomic force microscopy images with functionalized tips. Physical Review B 89 (20), S. 205407.

Schneiderbauer, Maximilian, Emmrich, Matthias, Weymouth, Alfred J. und Giessibl, Franz J. (2014) CO Tip Functionalization Inverts Atomic Force Microscopy
Contrast via Short-Range Electrostatic Forces. Physical Review Letters (PRL) 112, 166102-1-166102-5.

Wastl, Daniel S., Weymouth, Alfred J. und Giessibl, Franz J. (2014) Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy. ACS NANO 8 (5), S. 5233-5239. Volltext nicht vorhanden.

Pielmeier, Florian, Meuer, Daniel, Schmid, Daniel R., Strunk, Christoph und Giessibl, Franz J. (2014) Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures. Beilstein Journal of Nanotechnology (5), S. 407-412. Volltext nicht vorhanden.

Hofmann, Thomas, Pielmeier, Florian und Giessibl, Franz J. (2014) Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy. Physical Review Letters (PRL) 112 (6), 066101-1-066101-5. Zugang zum Volltext eingeschränkt.

Weymouth, Alfred J., Hofmann, Thomas und Giessibl, Franz J. (2014) Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy. Science 343 (6175), 1120-1-1120-5.

Back, Christian, Fabian, Jaroslav, Giessibl, Franz J., Richter, Klaus und Weiss, Dieter (2014) Spin Spin Spin Around - Der Sonderforschungsbereich 689. Blick in die Wissenschaft (29), S. 3-10. Volltext nicht vorhanden.

Wastl, Daniel S., Speck, Florian, Wutscher, Elisabeth, Ostler, Markus, Seyller, Thomas und Giessibl, Franz J. (2013) Observation of 4 nm Pitch Stripe Domains Formed by Exposing Graphene to Ambient Air. ACS Nano 7 (11), S. 10032-10037. Volltext nicht vorhanden.

Weymouth, Alfred J., Meuer, Daniel, Mutombo, Pingo, Wutscher, Thorsten, Ondracek, Martin, Jelinek, Pavel und Giessibl, Franz J. (2013) Atomic Structure Affects the Directional Dependence of Friction. Physical Review Letters 111 (12), S. 126103.

Welker, Joachim, Weymouth, Alfred J. und Giessibl, Franz J. (2013) The Influence of Chemical Bonding Configuration on Atomic Identification by Force Spectroscopy. ACS NANO 7 (8), S. 7377-7382. Volltext nicht vorhanden.

Wutscher, Thorsten, Niebauer, Johannes und Giessibl, Franz J. (2013) Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers. Review of Scientific Instruments 84, 073704-1.

Pielmeier, Florian und Giessibl, Franz J. (2013) Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy. Physical Review Letters (PRL) 110 (26), 266101-1-266101-5.

Giessibl, Franz J. (2013) Seeing the Reaction. Science 340 (6139), S. 1417-1418.

Wastl, Daniel S., Weymouth, Alfred J. und Giessibl, Franz J. (2013) Optimizing atomic resolution of force microscopy in ambient conditions. Physical Review B (PRB) 87 (24), 245415-1-245415-10.

Weymouth, Alfred Jay und Giessibl, Franz J. (2012) The effect of sample resistivity on Kelvin probe force microscopy. Applied Physics Letters 101, S. 213105-1.

Ionescu, Andrei, Wutscher, Elisabeth, Brambilla, Eugenio, Schneider-Feyrer, Sibylle, Giessibl, Franz J. und Hahnel, Sebastian (2012) Influence of surface properties of resin-based composites on in vitro Streptococcus mutans biofilm development. European Journal Of Oral Sciences 120 (5), S. 458-465. Volltext nicht vorhanden.

Wutscher, Thorsten, Weymouth, Alfred J. und Giessibl, Franz J. (2012) Localization of the phantom force induced by the tunneling current. Physical Review B (PRB) 85 (19), 195426-1-195426-6.

Welker, Joachim und Giessibl, Franz J. (2012) Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy. Science 336 (608), S. 444-449.

Welker, Joachim, Illek, Esther und Giessibl, Franz J. (2012) Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy. Beilstein Journal of Nanotechnology 3, S. 238-248.

Schneiderbauer, Maximilian, Wastl, Daniel S. und Giessibl, Franz J. (2012) qPlus magnetic force microscopy in frequencymodulation mode with millihertz resolution. Beilstein Journal of Nanotechnology 3, S. 174-178.

Giessibl, Franz J., Pielmeier, Florian, Eguchi, Toyoaki, An, Toshu und Hasegawa, Yukio (2011) Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Physical Review B (PRB) 84 (12), 125409-1-125409-15.

Weymouth, Alfred J., Wutscher, Thorsten, Welker, Joachim, Hofman, Thomas und Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). Physical Review Letters (PRL) 106 (22), 226801-1-226801-4.

Ternes, Markus, González, César, Lutz, Christopher P., Hapala, Prokop, Giessibl, Franz J., Jelinek, Pavel und Heinrich, Andreas J. (2011) Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts. Physical Review Letters (PRL) 106 (1), 016802-1-016802-4.

Welker, Joachim, de Faria Elsner, Frederico und Giessibl, Franz J. (2011) Application of the equipartition theorem to the thermal excitation of quartz tuning forks. Applied Physics Letters 99, 084102.

Wutscher, Elisabeth und Giessibl, Franz J. (2011) Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes. Review of Scientific Instruments 82, 093703.

Wutscher, Thorsten und Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. Review of Scientific Instruments 82 (2), 026106.

Tung, Raimond C., Wutscher, Thorsten, Martinez-Martin, David, Reifenberger, Ronald G., Giessibl, Franz J. und Raman, Arvind (2010) Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy. Journal of Applied Physics 107 (10), 104508-1-104508-8.

Hofmann, Thomas, Welker, Joachim und Giessibl, Franz J. (2010) Preparation of light-atom tips for scanning probe microscopy by explosive delamination. Journal of Vacuum Science & Technology B 28 (3), C4E28-C4E30.

Giessibl, Franz J. (2009) Auf die Spitze getrieben. Physik Journal 8 (11), S. 20-21. Volltext nicht vorhanden.

Gross, Leo, Mohn, Fabian, Meyer, Gerhard, Repp, Jascha und Giessibl, Franz J. (2009) Atomare Ladungszustände unter dem Rasterkraftmikroskop. Physik in unserer Zeit 40 (5), S. 225-226. Volltext nicht vorhanden.

Gross, Leo, Mohn, Fabian, Liljeroth, Peter, Repp, Jascha , Giessibl, Franz J. und Meyer, Gerhard (2009) Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy. Science 324 (5933), S. 1428-1431. Volltext nicht vorhanden.

Ternes, Markus, Heinrich, Andreas J. und Giessibl, Franz J. (2008) Wie viel Kraft ist nötig, um ein Atom zu bewegen? Physik in unserer Zeit 39 (3), S. 111-112.

Ternes, Markus, Lutz, Christopher P., Hirjibehedin, Cyrus F., Giessibl, Franz J. und Heinrich, Andreas J. (2008) The Force Needed to Move an Atom on a Surface. Science 319 (5866), S. 1066-1069.

Schmid, Martin, Mannhart, Jochen und Giessibl, Franz J. (2008) Searching atomic spin contrast on nickel oxide (001) by force microscopy. Physical Review B (PRB) 77 (4), 045402-1-045402-6.

Giessibl, Franz J. (2007) Ein atomarer Fingerabdruck. Physik Journal 6 (5), S. 22-23. Volltext nicht vorhanden.

Giessibl, Franz J. und Quate, Calvin F. (2006) Exploring the Nanoworld with Atomic Force Microscopy. Physics today 59 (12), S. 44-50. Volltext nicht vorhanden.

Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), S. 1696-1701. Volltext nicht vorhanden.

Schmid, Martin, Renner, Andreas und Giessibl, Franz J. (2006) Device for in situ cleaving of hard crystals. Review of Scientific Instruments 77 (3), 036101-1-036101-7.

Zotti, Linda A., Hofer, Werner A. und Giessibl, Franz J. (2006) Electron scattering in scanning probe microscopy experiments. Chemical Physics Letters 420 (1-3), S. 177-182.

Giessibl, Franz J. (2005) AFM's path to atomic resolution. Materials Today 8 (5), S. 32-41.

Herz, Markus, Schiller, Christian H., Giessibl, Franz J. und Mannhart, Jochen (2005) Simultaneous current-, force-, and work-function measurement with atomic resolution. Applied Physics Letters 86 (15), 153101-1-153101-3.

Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F. (2005) Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite. Physical Review Letters (PRL) 94 (5), 056101-1-056101-4.

Giessibl, Franz J. und Reichling, Michael (2005) Investigating atomic details of the CaF₂(111) surface with a qPlus sensor. Nanotechnology 16 (3), S. 118-124.

Hembacher, Stefan, Giessibl, Franz J. und Mannhart, Jochen (2004) Force Microscopy with Light-Atom Probes. Science 305 (5682), S. 380-383.

Giessibl, Franz J., Hembacher, Stefan, Herz, Markus, Schiller, C. H. und Mannhart, Jochen (2004) Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor. Nanotechnology 15 (2), S. 79-86.

Giessibl, Franz J. (2003) Atomic Force Microscopy on Its Way to Adolescence. AIP Conference Proceedings 696 (1), S. 60-67. Volltext nicht vorhanden.

Hembacher, Stefan, Giessibl, Franz J., Mannhart, Jochen und Quate, Calvin F. (2003) Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 100 (22), S. 12539-12542.

Giessibl, Franz J. (2003) Advances in Atomic Force Microscopy. Reviews of Modern Physics (RMP) 75 (3), S. 949-983.

Herz, Markus, Giessibl, Franz J. und Mannhart, F. (2003) Probing the shape of atoms in real space. Physical Review B (PRB) 68 (4), 045301-1-045301-7.

Giessibl, Franz J., Herz, Markus und Mannhart, Jochen (2002) Friction traced to the single atom. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 99 (19), S. 12006-12010.

Hembacher, Stefan, Giessibl, Franz J. und Mannhart, Jochen (2002) Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum. Applied Surface Science 188 (3-4), S. 445-449.

Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan und Mannhart, Jochen (2001) Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations. Annalen der Physik 10 (11-12), S. 887-910.

Giessibl, Franz J. (2001) Rasterkraftmikroskop sieht erstmals ins Innere des Atoms. Spektrum der Wissenschaft 2001 (April), S. 12-14. Volltext nicht vorhanden.

Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips. Applied Physics A: Materials Science & Processing 72 (Suppl1), S. 15-17.

Giessibl, Franz J. (2001) A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy. Applied Physics Letters 78 (1), S. 123-125.

Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen (2000) Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy. Science 289 (5478), S. 422-425.

Giessibl, Franz J. und Bielefeldt, Hartmut (2000) Physical interpretation of frequency-modulation atomic force microscopy. Physical Review B (PRB) 61 (15), S. 9968-9971.

Giessibl, Franz J. (2000) Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Applied Physics Letters 76 (11), S. 1470-1472.

Bielefeldt, Hartmut und Giessibl, Franz J. (1999) A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics. Surface Science 440 (3), L863-L867.

Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan und Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), S. 352-357.

Giessibl, Franz J. (1998) High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Applied Physics Letters 73 (26), S. 3956-3958.

Giessibl, Franz J. (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Physical Review B (PRB) 56 (24), S. 16010-16015.

Giessibl, Franz J. und Tortonese, Marco (1997) Self-oscillating mode for frequency modulation noncontact atomic force microscopy. Applied Physics Letters 70 (19), S. 2529-2531.

Giessibl, Franz J. (1995) Atomic Resolution of the Silicon (111 )-(7x 7) Surface by Atomic Force Microscopy. Science 267 (5194), S. 68-71.

Giessibl, Franz J. (1994) Atomic Force Microscopy in Ultrahigh Vacuum. Japanese Journal of Applied Physics (JJAP) 33, Part 1 (6B), S. 3726-3734. Volltext nicht vorhanden.

Giessibl, Franz J. und Trafas, Brian M. (1994) Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum. Review of Scientific Instruments 65 (6), S. 1923-1929.

Giessibl, Franz J. und Binnig, Gerd (1992) Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum. Ultramicroscopy 42-44 pt.1, S. 281-289.

Giessibl, Franz J. und Binnig, Gerd (1992) Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy. Physical Review B (PRB) 45 (23), 13815(R).

Giessibl, Franz J., Gerber, Christoph und Binnig, Gerd (1991) A low‐temperature atomic force/scanning tunneling microscope for ultrahigh vacuum. Journal of Vacuum Science and Technology B 9 (2), S. 984-988.

Gross, Leo, Schuler, Bruno, Mohn, Fabian, Moll, Nikolaj, Repp, Jascha und Meyer, Gerhard (2015) 12. Atomic Resolution on Molecules with Functionalized Tips. In: Morita, Seizo und Giessibl, Franz J. und Meyer, Ernst und Wiesendanger, Roland, (eds.) Noncontact Atomic Force Microscopy: Volume 3. NanoScience and Technology (12). Springer International Publishing, S. 223-246. ISBN 978-3-319-15587-6. Volltext nicht vorhanden.

Giessibl, Franz J. (2009) 6. Principles and Applications of the qPlus Sensor. In: Morita, Seizo und Giessibl, Franz J. und Wiesendanger, Roland, (eds.) Noncontact Atomic Force Microscopy : Volume 2. Springer, Berlin, S. 121-142. ISBN 978-3-642-01495-6. Volltext nicht vorhanden.

Morita, Seizo, Giessibl, Franz J., Sugawara, Yasuhiro, Hosoi, Hirotaka, Mukasa, Koichi, Sasahara, Akira und Onishi, Hiroshi (2005) 13. Noncontact Atomic Force Microscopy and its Related Topics. In: Bhushan, Bharat, (ed.) Nanotribology and Nanomechanics An Introduction. Springer, Berlin, S. 385-411. ISBN 978-3-540-24267-3. Volltext nicht vorhanden.

Giessibl, Franz J. (2004) Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy. In: Siffert, Paul und Krimmel, E. F., (eds.) Silicon : evolution and future of a technology. Springer, Berlin, S. 191-204. ISBN 3-540-40546-1. Volltext nicht vorhanden.

Giessibl, Franz J. (2003) B2. Principle of High-Resolution Atomic Force Microscopy. In: Blügel, Stefan und Luysberg, Martina und Urban, Knut und Waser, Rainer, (eds.) Fundamentals of nanoelectronics : lecture manuscripts of the 34th spring school of the Department of Solid State Research / Forschungszentrum Jülich GmbH, Institut für Festkörperforschung. Schriften des Forschungszentrums Jülich : Reihe Materie und Material, 14 (B2). Forschungszentrum, Zentralbibliothek, Jülich. ISBN 3-89336-319-X. Volltext nicht vorhanden.

Giessibl, Franz J. (2002) 2. Principle of NC-AFM. In: Morita, Seizo und Wiesendanger, Roland und Meyer, Ernst, (eds.) Noncontact atomic force microscopy. Band 1. Nanoscience and technology (2). Springer, Berlin, S. 11-46. ISBN 3-540-43117-9. Volltext nicht vorhanden.

Giessibl, Franz J. (2002) Pushing the Resolution Limits of the Force Microscope: from Steps to Atoms and Atomic Orbitals. In: Proceedings of the Scanning Probe Microscopy-2002 (SPM-2002) Workshop : 3 March - 6 March 2002, Nizhny Novgorod, Russia. Physics of low-dimensional structures, 2002,5/6. VSV, Moskau, S. 172-174. Volltext nicht vorhanden.

Giessibl, Franz J. (1999) Force Microscopy in Vacuum with Atomic Resolution. In: Kuk, Y. und Lyo, I. W. und Jeon, D. und Park, S. I., (eds.) Preliminary proceedings of STM : 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy ; 19 - 23 July, 1999, Seoul, Korea. , S. 19-20. Volltext nicht vorhanden.

Giessibl, Franz J. (2022) Erster Blick in das Innere eines Atoms - Begegnungen mit Gerhard Richter zwischen Kunst und Wissenschaft. Buchhandlung Walther und Franz König, Köln. ISBN 978-3-7533-0174-7. Volltext nicht vorhanden.

Morita, Seizo und Giessibl, Franz J. und Wiesendanger, Roland und Meyer, Ernst, eds. (2015) Noncontact Atomic Force Microscopy: Volume 3. NanoScience and Technology, (12). Springer. ISBN Hardcover 978-3-319-15587-6; eBook ISBN 978-3-319-15588-3. Volltext nicht vorhanden.

Morita, Seizo und Giessibl, Franz J. und Wiesendanger, Roland, eds. (2009) Noncontact Atomic Force Microscopy: Volume 2. NanoScience and Technology. Springer, Heidelberg, Berlin. ISBN Hardcover 978-3-642-01494-9; eBook ISBN 978-3-642-01495-6; Softcover ISBN: 978-3-642-26070-4. Volltext nicht vorhanden.

Weymouth, Alfred J. , Nam, Shinjae, Riegel, Elisabeth, Gretz, Oliver und Giessibl, Franz J. (2023) Data archive of "Exploring in-plane interactions beside an adsorbed molecule with lateral force microscopy". [Datensatz]

Nam, Shinjae , Gretz, Oliver , Hofmann, Oliver T. , Hörmann, Lukas , Giessibl, Franz J. und Weymouth, Alfred J. (2023) Data archive of "Sliding friction over single covalent bonds increases with bond order". [Datensatz]

Stilp, Fabian, Bereczuk, Andreas , Berwanger, Julian , Mundigl, Nadine, Richter, Klaus und Giessibl, Franz J. (2021) Data archive of "Very weak bonds to artificial atoms formed by quantum corrals". [Datensatz] Zugang zum Volltext eingeschränkt.

Welker, Joachim und Giessibl, Franz J. (2013) Abbildung der Symmetrien chemischer Bindungen. , Regensburg.